yieldHUB is excited to launch yieldHUB Live, our latest innovation at Microelectronics UK. Since 2005, yieldHUB has been trusted worldwide as the leading data analytics platform that empowers semiconductor companies to improve yield, reduce test costs, boost quality and enhance engineering efficiency. Our secure cloud platform transforms complex data into clear, actionable insights. With yieldHUB, you can explore powerful solutions such as traceability, parametric analysis and characterization. Now, with yieldHUB Live, we’re taking it a step further. What if you had real-time yield, bin and parametric performance data without changing your test program? With yieldHUB Live you can instantly detect stuck parts, monitor contact quality, spot site-to-site variations and cut retest. And it’s all powered by an AI recommendation system and a digital twin model. Find out more at booth #B45 or visit our website: www.yieldhub.com.
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